The TestEQ EATH-series rapid temperature change chamber applies controlled linear temperature ramps to a product to accelerate thermal fatigue and reveal temperature-related failure mechanisms. It is intended for thermal cycling where transition rate, uniformity and repeatability are critical.
Applications
- Semiconductor and IC reliability and thermal cycling
- PCB assemblies, solder joints and interconnects
- Automotive electronics and EV power modules
- Aerospace and communication equipment
- Battery cells and modules
- Materials and coatings
Configuration and features
- Temperature range -70 °C to +180 °C (200 °C optional).
- Linear temperature ramp rates from 5 °C/min to 30 °C/min; common rates are 5, 10, 15, 20 and 25 °C/min, with up to 30 °C/min available for selected configurations.
- Popular test range -40 °C to +85 °C.
- Temperature fluctuation ≤ ±0.5 °C; temperature deviation ≤ ±2.0 °C; temperature uniformity ≤ 2.0 °C.
- Temperature uniformity and control stability maintained at high ramp rates.
- Air circulation is designed to keep temperature uniformity and the rate at which the specimen sees the programmed temperature consistent.
- Air-cooled “Cold Fusion” airflow design.
- Pump water supply; window W×H 380×520 mm.
- PID control with programmable profile and RS-485 communication.
- Options include a high ramp rate upgrade (≥ 30 °C/min).
- Patent No.: CN201920954255.X.
Specifications
Model range (EATH series)
| Models | Capacity (m³) | Interior W×H×D (mm) |
|---|---|---|
| EATH800-40W5 / EATH800-40W10 / EATH800-40W15 | 0.8 | 1000×1000×800 |
| EATH800-55W5 / EATH800-55W10 / EATH800-55W15 | 0.8 | 1000×1000×800 |
| EATH1000-40W5 / EATH1000-40W10 / EATH1000-40W15 | 1.0 | 1000×1000×1000 |
| EATH1000-55W5 / EATH1000-55W10 / EATH1000-55W15 | 1.0 | 1000×1000×1000 |
The suffix after W indicates the configured ramp rate (W5 = 5 °C/min, W10 = 10 °C/min, W15 = 15 °C/min). Exterior dimensions vary with the accelerated-rate and temperature-range configuration; the source lists exterior W×H×D values of 1200×900×2670, 1200×930×2870, 1200×900×1970 and 1200×1900×2870 mm across the EATH800 / EATH1000 range.
Common specifications
| Parameter | Value |
|---|---|
| Temperature range | -70 °C to +180 °C (200 °C optional) |
| Ramp rate (linear) | 5–30 °C/min |
| Common rates | 5 / 10 / 15 / 20 / 25 °C/min |
| Typical range | -40 °C to +85 °C |
| Temperature fluctuation | ≤ ±0.5 °C |
| Temperature deviation | ≤ ±2.0 °C |
| Temperature uniformity | ≤ 2.0 °C |
| Airflow (Cold Fusion) | 200 L/Sec / 800 L/Sec (by configuration) |
| Window W×H (mm) | 380×520 |
| Humidity range (%RH) | 10–98 %RH |
| Humidity uniformity | ±1.0 %RH |
| Relative humidity deviation | ≤ +2.0 to −3 %RH (>75 %RH); ≤ ±5.0 %RH (≤75 %RH) |
| Water supply | pump supply |
| Control | PID, programmable profile, RS-485 |
| Noise | ≤ 68 dB |
| Power | AC380V, 3 phase 5 lines, 50/60 Hz |
| Patent No. | CN201920954255.X |
The humidity indicator applies to humidity-configured chambers. Actual performance depends on chamber size, temperature range, specimen mass, fixture design and test conditions; ramp-rate performance should be evaluated under the intended test load.
Standards
Chambers can be configured for test programs based on IEC 60068-2-14, IEC 60068-3-5, JEDEC JESD22-A104, MIL-STD-810, AEC-Q100, ISO 16750 and RTCA DO-160.
To match a ramp rate to a test profile, contact us with the required range, rate and specimen. Related: Thermal Shock Test Chamber , Temperature Humidity Vibration Test Chamber .