The TestEQ EATH-series rapid temperature change chamber applies controlled linear temperature ramps to a product to accelerate thermal fatigue and reveal temperature-related failure mechanisms. It is intended for thermal cycling where transition rate, uniformity and repeatability are critical.
Applications
- Semiconductor and IC reliability and thermal cycling
- PCB assemblies, solder joints and interconnects
- Automotive electronics and EV power modules
- Aerospace and communication equipment
- Battery cells and modules
- Materials and coatings
Configuration and features
- Temperature range -70 °C to +180 °C (200 °C optional).
- Linear temperature ramp rates from 5 °C/min to 30 °C/min; common rates are 5, 10, 15, 20 and 25 °C/min, with up to 30 °C/min available for selected configurations.
- Popular test range -40 °C to +85 °C.
- Temperature uniformity and control stability maintained at high ramp rates.
- Air circulation is designed to keep temperature uniformity and the rate at which the specimen sees the programmed temperature consistent.
- PID control with programmable profile and RS-485 communication.
- Options include a high ramp rate upgrade (≥ 30 °C/min).
Specifications
| Parameter | Value |
|---|---|
| Temperature range | -70 °C to +180 °C (200 °C optional) |
| Ramp rate (linear) | 5–30 °C/min |
| Common rates | 5 / 10 / 15 / 20 / 25 °C/min |
| Typical range | -40 °C to +85 °C |
| Control | PID, programmable profile, RS-485 |
Model designations include the EATH series (for example EATH800-40W5/W10/W15 and EATH1000-40W5/W10/W15); the number indicates the configured ramp rate.
Standards
Chambers can be configured for test programs based on IEC 60068-2-14, IEC 60068-3-5, JEDEC JESD22-A104, MIL-STD-810, AEC-Q100, ISO 16750 and RTCA DO-160.
To match a ramp rate to a test profile, contact us with the required range, rate and specimen. Related: Thermal Shock Test Chamber, Temperature Humidity Vibration Test Chamber.